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Official PDF TranslationPower Automation Equipment

Hardware-in-the-Loop Test Platform for Photovoltaic High-Frequency Controllers Based on UREP + FPGA

Authors: XU Tao; JIANG Chunhong; KUANG Weixing; HAO Zhenghang; CHEN Zhuo; XIONG Guojiang

DOI: 10.16081/j.epae.202605021Status: Verified Translated Edition
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Key Findings in This Report

• • FPGA-based PWM averaging achieves nanosecond-level sampling resolution, increasing sampling points per switching period from a few (under microsecond steps) to 2,500–10,000 points, reducing duty cycle jitter and numerical error accumulation that otherwise cause instability in HIL systems. • • The averaging technique eliminates frequent topology updates and state matrix reconstructions, lowering real-time computational load and enabling stable operation under strict real-time constraints with microsecond-level simulation steps, as validated by industrial-grade controller tests. • • The platform successfully performed two typical operating condition tests (steady-state and HVRT) on an industrial grid-connected controller, identifying non-compliant metrics that were fed back to the manufacturer for strategy optimization, demonstrating practical industrial applicability. • • The UREP+FPGA architecture provides a domestic alternative to RTDS and RT-LAB, offering a feasible technical path for high-frequency controller HIL testing without the modeling complexity and resource constraints associated with FPGA partitioning in existing commercial solutions.