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Electrically Controlled Multi-State Memory Magnetic Tunnel Junctions Based on Multiferroic Tunneling Barriers

Authors: HU Yixuan; XIE Wenhao; ZHANG Shichen; LIU Fangqi; XIONG Rui; LIU Yong; ZHU Sicong; WANG Ziyu

DOI: 10.1007/s40843-026-4491-3Status: Verified Translated Edition
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Key Findings in This Report

• • Achieves a giant TMR ratio of 1.1×10^4% (11000%) in a fully electrically controlled MTJ, surpassing the best experimental value (65% in CoFeB/MgO/CoFeB) by over two orders of magnitude, enabling higher read margins and noise immunity in memory arrays. • • Supports 4 or 10 distinct resistance states via electrical control, compared to only 2 states in conventional magnetically controlled MTJs, directly increasing data storage density per cell without scaling down physical dimensions. • • Eliminates the need for external magnetic fields, reducing write energy and enabling integration with CMOS logic, as the switching mechanism is purely voltage-driven, a critical advantage for low-power spintronic applications. • • Theoretical design validated by first-principles calculations, providing a predictive framework for experimental realization; the TMR ratio is 10 times higher than the best theoretical magnetoelectric co-controlled system (CrSb/In2Se3/Fe3GaTe2, TMR 1031%), indicating superior performance potential.