• • Bi doping increases the radiative recombination coefficient by one order of magnitude to 1.27×10−12 cm3/s, compared to intrinsic AgInS2 (9.63×10−13 cm3/s), directly enabling higher luminescence efficiency in light-emitting devices.
• • Sb doping reduces the radiative recombination coefficient by three orders of magnitude to 1.36×10−16 cm3/s and introduces deep-level states at 1.08 eV below the conduction band minimum, exacerbating nonradiative losses and rendering Sb-doped AgInS2 unsuitable for optoelectronic applications.
• • Under S-rich, In-poor, and Ag-moderate conditions, the formation energy of InAg antisite defects increases, reducing their concentration and mitigating deep-level trapping centers that limit carrier lifetimes.
• • BiIn defects remain neutral across the Fermi level range, demonstrating superior defect tolerance that suppresses deep-level states, whereas SbIn defects are electrically active and detrimental to radiative recombination.
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