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Lattice-Engineered High-Quality β-Ga2O3 Membranes for Memristive Applications Towards Image Encryption, Decryption, and Edge Detection

Authors: Nan He; Guokai Bai; Kunfang Chen; Xiang Wan; Jiahang Liu; Zi Li; Haiming Qin; Xiaojuan Lian; Xiaoyan Liu; Dapeng Yan; Yi Tong; Qiang Chen; Xueqiang Ji; Lei Wang

DOI: 10.1007/s40843-025-3858-8Status: Verified Translated Edition
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Key Findings in This Report

• • The Ag/β-Ga2O3/Pt memristor achieves an ON/OFF ratio exceeding 10^8, which is critical for reliable multi-bit storage and logic operations, outperforming conventional oxide memristors that typically exhibit ratios below 10^6. • • Ultra-low SET/RESET voltages of 0.13 V/−0.11 V and a programming current of 10^-10 A enable energy-efficient operation, reducing power consumption by orders of magnitude compared to traditional flash memory (which requires >10 V and >μA). • • Data retention exceeds 4 × 10^4 s (over 11 hours) without significant degradation, ensuring non-volatile memory stability for practical applications such as image encryption keys. • • Subthreshold swing of ~0.47 mV/dec indicates exceptional switching kinetics, enabling fast and precise control of resistive states, which is essential for high-speed neuromorphic computing.