• • The co-crystal dielectric dopant achieves a capacitance density of ~11.19 and a dielectric loss of ~0.03, breaking the trade-off in polymers and enabling high-performance FETs.
• • The hybrid material provides a breakdown strength of ~740 MV m−1, attributed to polyoxometalates, which is critical for high-voltage applications.
• • The cation-mediated co-crystallization strategy overcomes the charge-state limitation of traditional ion-pair assembly, allowing neutral clusters to be incorporated, thus expanding the design space for cluster-based materials.
• • The materials exhibit excellent solution processability, facilitating integration into polymer matrices for scalable device fabrication.