Anti-Thermal-Quenching Radioluminescence and High-Temperature X-ray Imaging of Tb3+-Doped Glass Scintillators
The demand for high-performance scintillators in high-temperature applications, such as industrial flaw detection and oil exploration, necessitates materials with both high efficiency and thermal robustness. This work reports Tb3+-doped oxyfluoride glass scintillators exhibiting anti-thermal-quenching radioluminescence (RL). Three synergistic strategies were employed: (i) an oxyfluoride glass host providing a low-phonon-energy environment, (ii) increased structural densification of the glass network, and (iii) thermally enhanced energy transfer from Ce3+ to Tb3+. The resulting scintillators achieve an optical transmittance exceeding 88% at 542 nm, a record RL intensity of 350% relative to a standard Bi4Ge3O12 (BGO) crystal, and an imaging resolution of 24 lp mm−1. Notably, the RL intensity at 633 K reaches 143% of its room-temperature (303 K) value, demonstrating significant anti-thermal-quenching behavior. In contrast, commercial BGO and CsI:Tl scintillators exhibit RL intensities dropping to approximately 1% under identical conditions. These results establish the potential of Tb3+-doped glass scintillators for high-temperature X-ray imaging and provide a strategic framework for developing thermally robust scintillating materials.